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Correction: Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects
TOKYO, Dec. 03, 2022 (GLOBE NEWSWIRE) — Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today unveiled the E5620 Defect Review Scanning Electron Microscope (DR-SEM), its newest mask SEM product for reviewing and classifying ultra-small defects on photomasks and mask blanks. With its high-accuracy, high-throughput defect review capability, the E5620 DR-SEM is expected to […] The post Correction: Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-...
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Correction
Advantest
Unveils
E5620
Dr
Sem
Review
Correction
Dr sem
Classification
Ultra small
Photomask
Defects
Forex
Posted: Dec 3 2022, 14:18
Author Name: forextv
Views: 102499